Spectrum Generation in NISTMonte

by Nicholas W. M. Ritchie.

Accurate x-ray spectrum simulation depends upon reliable models of the many different physical processes involved in electron-generated x-ray emission. A lack of understanding of any of the following: electron scattering, x-ray absorption, inner-shell ionization, x-ray emission, or Bremsstrahlung emission will lead to simulated spectra that differ from measured spectra. These differences can be used as clues to identify flaws in and to refine the underlying models. NIST has developed a Monte Carlo simulation of electron transport to facilitate trying and assessing new models. Most microanalytical measurements made today rely on the understanding of these underlying models. [via]

http://www.cstl.nist.gov/projects/fy05/data05...